Author: Joseph Goldstein
Edition: 3rd
Binding: Hardcover
ISBN: 0306472929
Edition: 3rd
Binding: Hardcover
ISBN: 0306472929
Scanning Electron Microscopy and X-ray Microanalysis
Categories: Scanning electron microscopy, X-ray microanalysis. Contributors: Joseph Goldstein - Author. Format: Hardcover
Scanning Electron Microscopy and X-ray Microanalysis
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis
Categories: Scanning electron microscopy, X-ray microanalysis, Scanning electron microscopy. Contributors: Joseph Goldstein - Author. Format: Hardcover
Categories: Scanning electron microscopy, X-ray microanalysis. Contributors: Joseph Goldstein - Author. Format: Hardcover
Scanning Electron Microscopy and X-Ray Microanalysis
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